publications

  1. D. K.Das, S. Chakraborty and B. B. Bhattacharya, “Irredundant binate realizations of unate functions,” International Journal of Electronics, vol. 25, no. 1, pp. 65-73, 1993.
  2. S. Chakraborty, D. K. Das and B. B. Bhattacharya, “Logical redundancies in irredundant combinational circuits,” Journal of Electronic Testing: Theory and Applications, vol. 25, no. 1, pp. 120-125, 1993.
  3. D. K. Das, U. K. Bhattacharya and B. B. Bhattacharya, “Isomorph redundancy in sequential circuits,” IEEE Transactions on Computers, pp. 992-997, September 2000.
  4. Chakraborty, S. Das, D. K. Das and B. B. Bhattacharya, “Synthesis of symmetric functions for path delay fault testability,” IEEE Transactions on Computer-Aided Design, pp. 1076-1081, September 2000.
  5. Chiiho Sano, Takahiro Mihara, Tomoo Inoue, Debesh K. Das and Hideo Fujiwara, “A partial scan design method for sequential circuits with hold,” Transactions on IEICE (DI), vol. J83, no.9, pp. 981-990, Sep. 2000. (In Japanese).
  6. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count,” Journal of Computer Science and Technology, Springer Science, USA, vol. 17, no. 6, pp. 731-737, Nov. 2002
  7. D. K. Das, S. Chakraborty and B. B. Bhattacharya, “Universal and robust testing of stuck-open faults in Reed-Muller Canonical CMOS circuits,” International Journal of Electronics, vol. 90. no.1, pp. 1-11, January 2003.
  8. H. Rahaman, D. K.Das, and B. B. Bhattacharya, “Testing of stuck-open faults in Generalized Reed Muller and EXOR sum-of-products circuits,” IEE Proceeding: Computers and Digital Techniques, vol. 151, no. 1, pp. 83-91, January 2004.
  9. D. K. Das, S. Ohtake, and H. Fujiwara, “New non-scan DFT techniques to achieve 100% -fault efficiency,” Journal of Electronic Testing: Theory and Applications (JETTA), vol. 20, no. 3, pp. 315-323, 2004.
  10. Y. Zorian, D. K. Das, H. Fujiwara, Y. Li, Y. Min and S. Xu, “Design & Test Education in Asia,” IEEE Design & Test of Computers, pp. 331-338, 2004.
  11. Rahaman, D. K. Das, and B. B. Bhattacharya “A Simple Delay Testable Synthesis of Symmetric Functions,” LNCS-3285, vol. 3285, Springer Verlag, Berlin, pp. 263-270, October 2004.
  12. H. Rahaman, and D. K. Das, “Modeling ESOP Networks for Detecting Multiple Stuck-at Faults,” International Journal of AMSE, France, Vol. 10, No.4, pp.25-36, 2005.
  13. S. Roy, B. K. Sikdar and D. K. Das, “A degree-of-freedom based synthesis scheme for sequential machines with enhanced BIST quality and reduced area,” Journal of Electronic Testing: Theory and Applications (JETTA), vol. 21, no. 1, pp. 83-93, 2005.
  14. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Implementing Symmetric Functions with Hierarchical Modules for Stuck-at and Path-Delay Fault Testability,” Journal of Electronic Testing: Theory and Applications (JETTA) 22: 125-142, 2006, Springer Science, USA.
  15. H. Rahaman, and D. K. Das, “Testing of Stuck-at and Bridging Faults in Double Fixed-Polarity Reed-Muller (DFPRM) PLA”, IEE Computers and Digital Techniques, Vol.153, No. 2, March 2006.
  16. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Testable Design of Digital Summation Threshold Logic (DSTL) Array for Synthesis of Symmetric functions,” International Journal of Computer Applications, ACTA press, pp. 115-123, Volume 29, No. 2, 2007.
  17. H.Rahaman, D. K. Das, and B. B. Bhattacharya, “An Adaptive BIST Design for Detecting Multiple Stuck-Open Faults in CMOS Complex Cell,” IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 12, pp.2838-2845, December 2008.
  18. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Testable Design of AND-EXOR Logic Networks with Universal Tests for Detecting Stuck-at and Bridging Faults,” International Journal of Computers and Electrical Engineering (Elsevier),vol. 35, issue 5, pp.644-658, September 2009.
  19. H. Rahaman, D. Kole, D. K. Das, and B. B. Bhattacharya, “On the Detection of Bridging Fault in Reversible Circuits”, The IUP Journal of Computer Sciences, vol. IV, no.4, 28-41, October 2010.
  20. Hafizur Rahaman, Dipak K. Kole, Debesh K. Das, and Bhargab B. Bhattacharya, “Fault Diagnosis for Missing-Gate Fault (SMGF) Model in Reversible Quantum Circuits,” International Journal of Computers and Electrical Engineering (Elsevier), vol. 37, issue 4, pp. 475-485, July 2011.
  21. Dipak K. Kole, Hafizur Rahaman, Debesh K. Das, and Bhargab B. Bhattacharya, “Derivation of test set for detecting multiple missing-gate faults in reversible circuits,” International Journal of Computers and Electrical Engineering (Elsevier),  vol. 39,issue 2, pp. 225-236 February, 2013.
  22. Arighna Deb, Debesh K Das and Susmita Sur Koley, “ A Modular Design to Synthesize Symmetric Functions using Quantum Quaternary Logic,” Journal of Low Power Electronics ,  vol. 10, no. 3, pp. 443-454, 2014.
  23. Debesh K Das and Hideo Fujiwara, “One More Class of Sequential Circuits having Combinational Test Generation Complexity,” Journal of Electronic Testing: Theory and Applications, vol. 31, issue 3, pp. 321-327, June 2015.
  24. Arindam Banerjee and Debesh K. Das, “The design of reversible signed multiplier using ancient Indian mathematics.,”  Journal of Low Power Electronics ,  vol. 11, no. 4, pp.467-478, 2015.
  25. Arindam Banerjee and Debesh K. Das, “A New Squarer Design with Reduced Area and Delay,”  IET Computers and Digital Techniques,  vol. 10, no. 5,  pp. 205 – 214, september, 2016.
  26. Arighna Deb, Debesh K Das, Hafizur Rahaman, and Bhargab B. Bhattacharya, Robert Willie and Rolf Drechsler, “Reversible Synthesis of Symmetric Functions with a Simple Regular Structure and Easy Testability,” ACM Journal on Emerging Technologies in Computing Systems, Volume 12(4):34, June 2016.
  27. Arighna Deb and Debesh K Das, “An iterative structure for synthesizing symmetric functions using quantum-dot cellular automata”, Microprocessors and Microsystems, 53 (2017), pp. 157-167, 2017.
  28. Tanusree Kaibartta, Chandan Giri, Hafizur Rahaman, Debesh Kumar Das, “Approach of genetic algorithm for power-aware testing of 3D IC. IET Computers & Digital Techniques 13(5): 383-396, 2019.
  29. Bappaditya Mondal, Chandan Bandyopadhyay, Dipak Kumar Kole, Debesh Kumar Das & Hafizur Rahaman, “Test Generation from Boolean Generator for Detection of Missing Gate Faults (MGF) in Reversible Circuit Using Boolean Difference Method,”  IETE Journal of Research, July 2019
  30. Joyati mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman and Debesh Kumar Das, “Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits,” Journal of Circuits, Systems and Computers, 28(12): 1950212, 2019.
  31. Tanusree Kaibartta, G. P. Biswas, and Debesh Kumar Das, “Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs” Journal of Electronic Testing: Theory and Applications, vol. 36, issue 2, February 2020.
  32. Subrata Das, Debesh Kumar Das, and Soumya Pandit,  “A Global Routing Method for Graphene Nanoribbons Based Circuits and Interconnects, Journal on Emerging Technologies in Computing Systems,” Accepted, 2020
  33. Arindam Banerjee and Debesh K. Das, “A novel ALU circuit based on reversible logic,” Journal of Circuits, Systems and Computers, Accepted, 2020.
  34. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Universal Test Set for Detection of Stuck-at Faults in GRM (Generalized Reed-Muller) Circuits,” in Progress in VLSI Design and Test (Ed. C. P. Ravikumar), Elite Publishing, New Delhi, pp. 351-360, 2003.
  35. D. K. Das, and B. B. Bhattacharya, “Redundancy and Undetectability of Faults in Logic Circuits: A Tutorials,” in Progress in VLSI Design and Test (Ed. C. P. Ravikumar), Elite Publishing, New Delhi, pp. 514-526, 2004.
  36. H. Rahaman, D. K. Das, and B. B. Bhattacharya: Synthesis and testing of reversible logic circuits – A survey, in Progress in VLSI Design and Test (Ed. C. P. Ravikumar), Elite Publishing, New Delhi, pp. 71-80, 2005.
  37. H. Rahaman, D. K. Kole, D. K. Das, and B. B. Bhattacharya: Detection of bridging faults in reversible circuits, in Progress in VLSI Design and Test (Ed. C. P. Ravikumar), Elite Publishing, New Delhi, pp. 384-392, August 2006.
  38. D. K. Das and B. B. Bhattacharya, “Testable design of non-scan sequential circuits using extra logic,” in Proceedings of the IEEE Asian Test Symposium, pp. 176-182, 1995.
  39. D. K. Das and B. B. Bhattacharya, “Does retiming affect redundancy in sequential circuits?” in Proceedings of the 9th IEEE International Conference on VLSI Design, pp. 260-263, 1996.
  40. D. K. Das, U. K. Bhattacharya and B. B. Bhattacharya, “Isomorph redundancy in sequential circuits,” in Proceedings of the 14th IEEE VLSI Test Symposium, pp. 463-468, USA, 1996
  41. D. K. Das, S. Chakraborty and B. B. Bhattacharya, “New BIST techniques for detecting CMOS stuck-open faults,” in Proceedings of the 10th IEEE International Conference on VLSI Design, pp. 303-308, 1997.
  42. D. K. Das, S. Chakraborty and B. B. Bhattacharya, “Universal and robust testing of stuck-open faults in Reed-Muller Canonical CMOS circuits,” in Proceedings of 3rd International Workshop on Applications of the Reed-Muller Expansion in Circuit Design (REED-MULLER 97), pp. 259-268, 1997.
  43. D. K.Das, I. Chaudhury and B. B. Bhattacharya, “Design of an optimal test pattern generator for built-in self testing of path delay faults” in Proceedings of the 11th IEEE International Conference on VLSI Design, pp. 205-210, 1998.
  44. D. K. Das, S. Chakraborty and B. B. Bhattacharya, “Interchangeable boolean functions and their effects on redundancy in logic circuits,” in Proceedings of the IEEE Asia and South Pacific Design Automation Conference, pp. 469-474, Japan, 1998.
  45. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “An adaptive BIST to detect multiple stuck-open faults in CMOS circuits,” in Proceedings of the IEEE Asia and South Pacific Design Automation Conference, Hong Kong, pp. 287-290, January 1999.
  46. S. Chakraborty, S. Das, D. K. Das and B. B. Bhattacharya, “Synthesis of symmetric functions for path delay fault testability,” in Proceedings of the 12th IEEE International Conference on VLSI Design, 1999.
  47. D. K. Das, S. Ohtake, and H. Fujiwara, “New DFT techniques of non-scan sequential circuits with complete fault efficiency,” in Proceedings of the IEEE Asian Test Symposium, pp. 263-268, China, 1999.
  48. B. Sikdar, D. K. Das, and B. B. Bhattacharya, “Fixed spectral coefficients to detect multiple stuck-at faults in combinational circuits,” in Proceedings of 4th International Workshop on Applications of the Reed-Muller Expansion in Circuit Design (REED-MULLER 99), Victoria, Canada, pp. 133-137,1999.
  49. D. K. Das, S. Chakraborty and B. B. Bhattacharya, “Boolean algebraic properties of fault behavior in logic circuits, ” in Proceedings of the 4th International Workshops on Boolean Problems, Germany, pp. 143-150, September, 2000.
  50. T. Inoue, D. K. Das, C. Sano, T. Mihara, and H. Fujiwara, “Test generation and design-for-testability based on acyclic structure with hold registers,” Digest of IEEE 2000 Int. Workshop on RTL ATPG & DFT (WRTLT2000), pp. 1-10, Sept. 2000.
  51. T. Innoue, D. K. Das, C. Sano, T. Mihara and H. Fujiwara, “Test generation of acyclic sequential circuits with hold registers,” in Proceedings of the IEEE/ACM International Conference on Computer-Aided Design November, pp. 550-556, U. S. A., 2000.
  52. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Transition Count based BIST for Detecting Multiple Stuck-Open Faults in CMOS Circuits,” in Proceedings of The 2nd IEEE Asia-Pacific Conferences on ASICs (AP-ASIC 2000), Korea, pp. 307-310, August,  2000.
  53. D. K. Das, B. B. Bhattacharya, S. Ohtake, and H. Fujiwara, “Testable design of sequential circuits with improved fault efficiency,” in Proceedings of the 14th IEEE International Conference on VLSI Design, pp. 128-131, 2001.
  54. B. Sikdar, P. Majumdar, M. Mukherjee, N. Ganguly, D. K. Das and P. Pal Chaudhury, “Hierarchial cellular automata as on-chip test pattern generator,” in Proceedings of the 14th IEEE International Conference on VLSI Design, pp. 403-408, 2001.
  55. B. Sikdar, D. K. Das, V. Boppana, C. Yang, S. Mukherjee and P. Pal Chaudhury, “GF(2p) Cellular automata as a built in self test structure,” in Proceedings of the IEEE Asia and South Pacific Design Automation Conference, pp. 319-324, Japan, January 2001.
  56. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Universal and robust testing of stuck-open faults in GRM and ESOP circuits,” in Proceedings of 5th International Workshop on Applications of the Reed-Muller Expansion in Circuit Design (REED-MULLER 01), USA, 2001.
  57. S. Roy, B. K. Sikdar, M. Mukherjee and D. K. Das, “Enhancing BIST Quality of Sequential Machines Through Degree-of-freedom Analysis,” in Proceedings of the IEEE Asian Test Symposium, pp. 263-268, Japan, 2001.
  58. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “A new synthesis of symmetric functions,” in Proceedings of the 15th IEEE International Conference on VLSI Design and Asia and South Pacific Design Automation Conference (VLSI-ASPDAC 2002), pp. 160-165, 2002.
  59. S. Roy, B. K. Sikdar, M. Mukherjee and D. K. Das, “Degree-of-freedom analysis for sequential machines targeting BIST quality and gate area,” in Proceedings of the 15th IEEE International Conference on VLSI Design and Asia and South Pacific Design Automation Conference (VLSI-ASPDAC 2002), pp. 671-676, 2002.
  60. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “A Simple Delay-Testable Design of Digital Summation Threshold Logic (DSTL) Array,” in Proceedings of the 5th International Workshops on Boolean Problems, Germany, September, 2002.
  61. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Mapping symmetric functions to hierarchical modules for delay testablity,” Proceedings of the IEEE Asian Test Symposium, China, November 2003.
  62. Pradipta Maji, Chandrama Shaw, Rishi Nandi, Debesh K Das, P. Pal Chaudhuri, “Design of a Cellular Automata Based Pattern Classifier,”  Proceedings of 2nd International Conference on Applied Artificial Intelligence, India, December, 2003
  63. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Easily testable realizations of ESOP networks for detecting stuck-at and bridging faults,” Proceedings of the IEEE International Conference on VLSI Design, pp. 487-492, January 2004.
  64. H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Testable design of GRM networks for detecting stuck-at and bridging faults,” Proceedings of the IEEE Asia and South Pacific Design Automation Conference, Japan, pp. 224-229, January 2004.
  65. H. Rahaman and D. K. Das, “A simple delay testable synthesis of symmetric functions,” Proceedings of the IEEE Asian Applied Computing Conference, Nepal in October,2004.
  66. D. K. Das, T. Innoue, S. Chakraborty and H. Fujiwara, “Max-testable class of sequential circuits having combinational test generation complexity,” Proceedings of IEEE Asian Test Symposium, Taiwan, pp. 342-347, November 2004.
  67. Rahaman and D. K. Das, “Bridging fault detection in double fixed polarity Reed-Muller (DFPRM) PLA,” in Proceedings of IEEE Asia and South Pacific Design Automation Conference, Japan, vol. 1/2, page 172-177, 2005.
  68. S. Roy, B. K. Sikdar, and D. K. Das, “Cellular automata based test structures with logic folding,” IEEE International Conference on VLSI Design, January 2005.
  69. B.K. Sikdar, A. Sarkar, S. Roy and D.K. Das, “Synthesis of testable finite state machine through decomposition,” IEEE Asian Test Symposium, India, December 2005.
  70. H. Rahaman and D. K. Das, “Double Fixed-Polarity Reed-Muller (DFPRM) Design with universal test set of lower length,” 7th International Symposium on Representations and Methodology of Future Computing Technologies (RM2005), Tokyo, 2005.
  71. H. Rahaman, B. K. Sikdar, and D.K. Das, “Synthesis of Symmetric Boolean Functions Using Quantum Cellular Automata”, International Conference on Design & Test of Integrated Systems in Nanoscale Technology (DTIS 06), pp.119-124, Tunis, Tunisia.
  72. H. Rahaman, D. Kole, D. K. Das, and B. B. Bhattacharya, “Optimum Test Set for Bridging Faults Detection in Reversible Circuits”, IEEE Asian Test Symposium 2007, pp.125-128.
  73. H. Rahaman, D. Kole, D. K. Das, and B. B. Bhattacharya, “On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set”, in Proceedings of International Conf. on VLSI Design 2008, pp. 163-168.
  74. Dipak K. Kole, H. Rahaman, D. K. Das, and B. B. Bhattacharya, “A Constructive Algorithm for Synthesis of Reversible Logic Circuits”, in Proceedings of ICIT 2009, pp.23-28.
  75. Dipak K. Kole, H. Rahaman, Debesh K Das and Bhargab B. Bhattacharya, “Optimal Reversible Logic Circuits Synthesis based on a Hybrid DFS-BFS Technique”, in Proceedings of IEEE International Symposium on Electronic Design (ISED 2010) pp 208-212, India, December, 2010.
  76. Dipak K. Kole, H. Rahaman, Debesh K Das and Bhargab B. Bhattacharya, “Derivation of Optimal Test set for Detection of Multiple Missing-Gate Faults in Reversible Circuits’, in Proceedings of IEEE Asian Test Symposium (ATS 2010), Shanghai, pp.33-38, November, 2010.
  77. Dipak K. Kole, H. Rahaman, Debesh K Das and Bhargab B. Bhattacharya,, “Detection of Multiple Missing-Gate Faults in Reversible Circuits”, in Proceedings of Intl. workshop on Reversible Computation,  pp. 117-124, Germany, July 2010.
  78. Dipak K. Kole, H. Rahaman, D. K. Das, and B. B. Bhattacharya, “Synthesis of Online Testable Reversible Circuit”, in Proceedings of 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems , DDECS2010, pp.277-280, Austria, April 2010.
  79. Surajit K. Roy, Chandan Giri, Arnab Chakraborty, Subhro Mukherjee, Debesh K. Das, and Hafizur Rahaman, “Test Architecture Design for TSV based 3D Stacked ICs using Hard SOCs,” in Proceedings of the IEEE East-West Design & Test Symposium (EWDTS), Ukraine, September,  2011.
  80. Surajit Kumar Roy, Chandan Giri, Arnab Chakraborty, Subhro Mukherjee, Debesh K. Das and Hafizur Rahaman, “Optimization of Test Wrapper for TSV Based 3D SOCs”, in Proceedings of the IEEE International Symposium on Electronic Design (ISED 2011), pp.188-193, 2011.
  81. Dipak Kole, Hafizur Rahaman, Debesh K Das and Bhargab B. Bhattacharya “Derivation of Automatic Test Set for Detection of Missing Gate Faults in Reversible Circuits”, IEEE International Symposium on Electronic Design (ISED 2011) ,  pp. 200-205, 2011.
  82. Debesh K. Das, Subhrajit Sinha Roy, A. Dmitiriev, A. Morozov, and   M. Gössel, “Constraint Don’t cares for Optimizing Designs for Concurrent Checking by 1-out-of-3 Codes,” in Proceedings of the 10th International Workshops on Boolean Problems, Freiberg, Germany, September, 2012, pp. 33-40.
  83. Joyati Mondal, Debesh K. Das, Dipak K. Koley, and Hafizur Rahaman, “A Design for Testability Technique for Quantum Reversible Circuits,” in Proceedings of the IEEE East-West Design & Test Symposium (EWDTS), Ukraine, September, 2012, pp. 249-252.
  84. M. Pradhan, C. Giri, H. Rahaman, and D. K. Das, “An Algorithm for Core-Based Test Time Optimization for 3-D Integrated Circuits”, The Thirteenth IEEE Workshop on RTL and High-Level Testing, 22-23 November, 2012, Niigata, Japan.
  85. Papiya Manna, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das and Bhargab B. Bhattacharya, “Reversible Logic Circuits Synthesis using Genetic Algorithm and Particle Swarm Optimization,” Proceedings of IEEE International Symposium on Electronic Design (ISED 2012) , 2012, pp.
  86. Joyati Mondal, Debesh K. Das, Dipak K. Koley, and Hafizur Rahaman, “Design for Testability Techniques for Quantum Reversible Circuits,” 4th IEEE International Workshop on Reliability Aware System Design and Test,  Pune, January, 2013.
  87. Arighna Deb, Debesh K Das, Hafizur Rahaman and Bhargab B. Bhattacharya, “Reversible synthesis of symmetric Boolean functions based on unate decomposition,” IEEE International Conference GLSVLSI, 2-4 May,2013, Paris, France.
  88. Arighna Deb, Debesh K Das, Hafizur Rahaman, Bhargab B. Bhattacharya, Robert Willie and Rolf Drechsler, “Reversible circuit synthesis of symmetric functions using a simple regular structure,” 5th IEEE International Conference on Reversible Computing, 4-5 July, 2013, Victoria, Canada.
  89. Joyati Mondal, Debesh K. Das, Dipak K. Koley, Hafizur Rahaman anf Bhargab B Bhattacharya “On Designing Testable Reversible Circuits Using Gate Duplication,” 17th IEEE International Symposium on  VLSI Design and Test, 27-30 July, 2013, Jaipur, India.
  90. M. Pradhan, C. Giri, H. Rahaman, and D. K. Das,, “Optimal Stacking of SOCs in a 3D-SIC for Post-Bond Testing,” IEEE International Conference on 3D System Integration (3D IC), October, 2013, San Francisco, USA.
  91. M. Pradhan, C. Giri, H. Rahaman, and D. K. Das,, “Optimizing Test Time for Core-based 3-D Integrated Circuits by a Technique of Bi-partitioning,” IEEE East-West Design & Test Symposium (EWDTS), Rostov-on-Don, Russia, September, 2013.
  92. Arighna Deb, Debesh K Das and Susmita Sur Koley, “ Modular Design for Symmetric Functions using Quantum Quaternary Logic,” IEEE International Symposium on Electronic Design (ISED 2013) ,  Singapore2013.
  93. Arindam Banerjee and Debesh K Das, “The Design of Reversible Multiplier using Ancient Indian Mathematics,” IEEE International Symposium on Electronic Design (ISED 2013),  Singapore, 2013.
  94. Debesh K Das, Rupali Mitra,  and Bhargab B Bhattacharya, “A Functional Approach to Robust Testability of Path-Delay Faults in Two-Level Circuits,” 5th IEEE International Workshop on Reliability Aware System Design and Test,  Mumbai, January, 2014.
  95. Joyati Mondal and Debesh K Das, “Analogy between Quantum Reversible Circuit and Digital Logic with Respect to Test Generation,” 5th IEEE International Workshop on Reliability Aware System Design and Test,  Mumbai, January, 2014.
  96. Debesh K Das, Debabani Chowdhury, Bhargab B Bhattacharya, and Tsutomu Sasao, “Inadmissible Class of Boolean Functions under Stuck-at Faults,” Proceedings of IEEE 44th International Symposium on Multiple-Valued Logic (ISMVL 2014),  Bremen, Germany, pp. 237-242, May 2014.
  97. Rupali Mitra, Debesh K Das and Bhargab B Bhattacharya, “On Designing Robust Path-Delay Fault Testable Combinational Circuits based on Functional Properties” IEEE Computer Society Annual Symposium on VLSI, Tampa, Florida, pp. 202-207, 9-11 July 2014.
  98. Arindam Banerjee and Debesh K Das, “Efficient Squaring in Reversible Logic using Reduced Garbage and Ancillary Inputs,” 6th IEEE International Conference on Reversible Computing, 10-11 July, 2014, Kyoto, Japan.
  99. Arighna Deb and Debesh K Das, “A Regular Network of Symmetric Functions in Quantum-Dot Cellular Automata,” 18th IEEE International Symposium on VLSI Design and Test, 16-18 Coimbatore, India, 1-6, July, 2014.
  100. P Dasgupta, P Dasgupta and Debesh K Das, “A Novel Algorithm for Interconnect-aware Two-level Optimization of Multi-output SOP functions,” Proceedings of 11th International Workshop on Boolean Problems, Freiberg, Germany, September, pp. 219-226, 2014.
  101. Bappaditya Mondal, Dipak Kumar Kole, Debesh Kumar Das and Hafizur Rahaman, “Generator for Test Set Construction of SMGF in Reversible Circuit by Boolean Difference Method,” Proceedings of The 23rd IEEE Asian Test Symposium, China, November 16-19, pp. 68-73, 2014.
  102. Arindam Banerjee and Debesh K Das, “Squaring in Reversible Logic using Iterative Structure,” IEEE East-West Design & Test Symposium (EWDTS), Kiev, Ukraine, 1-4, September, 2014.
  103. Arighna Deb, Debesh K Das and Bhargab B Bhattacharya, “Synthesis of Symmetric Boolean Functions Using a Three-Stage Network,” Proceedings of IEEE International Symposium on Electronic Design (ISED 2014), NITK, Mangalore, India, pp. 182-186, December 2014.
  104. Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman and Debesh Kumar Das, “Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits,” 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems , DDECS2015, 22-24 April, 2015, Belgrade, Serbia.
  105. A. Deb, R. Wille, R. Drechsler, and D. K. Das, “An Efficient Reduction of Common Control Lines for Reversible Circuit Optimization,” in IEEE 45th International Symposium on Multiple-Valued Logic (ISMVL 2015),  Canada, May 2015.
  106. Sabyasachee Banerjee, Subhashis Majumder and Debesh K. Das, “Partitioning-based Test Time Reduction for Core-Based 3DICs,” IEEE International Symposium on VLSI Design and Test, 26-29 June, 2015, Ahmedabad, India.
  107. Arindam Banerjee and Debesh K. Das, “Squarer Design with Reduced Area and Delay,” IEEE International Symposium on VLSI Design and Test, 26-29 June, 2015, Ahmedabad, India.
  108. Tanusree Kaibarta and Debesh K. Das, “Optimizing Test Time for Core-Based 3-D Integrated Circuits by Genetic Algorithm,” 6th Asia Symposium on Quality Electronic Design (ASQED 2015), August, 2015, Kualalumpur, Malayasia.
  109. Joyati Mondal, Debesh Kumar Das and Bhargab B Bhattacharya, “Design-for-Testability in Reversible Logic Circuits based on Bit-Swapping,” The 24th IEEE Asian Test Symposium, Mumbai, November 23-25, 2015.
  110. Tanusree Kaibarta and Debesh K. Das, “Testing of 3D IC with minimum power using Genetic Algorithm,” 10th IEEE International Design & Test Symposium (IDT’15), Jordan, December 14-16, 2015.
  111. Arindam Banerjee and Debesh K. Das, “Squaring in Reversible Logic using Zero Garbage and Reduced Ancillary inputs,”  Proceedings of the  IEEE International Conference on VLSI Design, Kolkata, January 4-6, 2016.
  112. Subrata Das, Soma Das, Adrija Majumdar, Parthasarathi Dasgupta and Debesh Kumar Das, “Delay estimates for Graphene nanoribbons: a novel measure of fidelity and experiments with global routing trees,” IEEE International Conference GLSVLSI, 18-20 May, 2016, Boston, USA.
  113. Debabani Chowdhury, Debesh K Das,  Bhargab B Bhattacharya, and Tsutomu Sasao, “On the Inadmissible Class of Multiple-Valued Faulty-Functions under Stuck-at Faults,” IEEE 44th International Symposium on Multiple-Valued Logic (ISMVL 2016), Sapporo, Japan, May 2016.
  114. Subrata Das, Parthasarathi Dasgupta, Petr Fiser, Sudip Ghosh,and Debesh Kumar Das, “A Rule-Based Approach for Minimizing Power Dissipation of Digital Circuits, 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems , DDECS2016, 22-24 April, 2016, Belgrade, Serbia.
  115. Debasis Pal,Abir Pramanik, Parthasarathi Dasgupta and Debesh Kumar Das, “Double Patterning Lithography (DPL)-Compliant Layout Construction (DCLC) with Area-Stitch Usage Tradeoff”, IEEE International Symposium on VLSI Design and Test, 24-27 May, 2016, IIT Guwahati, India.
  116. Debabani Chowdhury, Debesh K Das,  Bhargab B Bhattacharya, and Tsutomu Sasao, “On the Properties of Root-Functions in Logic Circuits,” Proceedings of 12th International Workshop on Boolean Problems, Freiberg, Germany, September,  2016.
  117. Archi  Bhattacharya and Debesh Kumar Das, “Recognition of Ragas of Hindustani Music Played on Harmonium,” 22nd International Symposium on Frontiers of Research in Speech and Music (FRSM) 2016, Baripada, Orissa, India, November, 2016.
  118. Arindam Banerjee and Debesh K Das, “A New ALU Architecture Design using Reversible Logic,” Proceedings of IEEE International Symposium on Embedded Computing and System Design (ISED 2016), Patna, India, December 2016.
  119. Joyati Mondal and Debesh K Das, “Design for testability technique of reversible logic circuit based on exclusive testin,” 8th IEEE International Workshop on Reliability Aware System Design and Test,  Mumbai, January, 2017.
  120. Subrata Das, and Debesh K. Das, “A Technique to Construct Global Routing Trees for Graphene Nanoribbon (GNR),” The 18th International Symposium on Quality Electronic Design (ISQED 2017), Santa Clara, USA, March 2017.
  121. Joyati Mondal and Debesh K Das, “Design for Testability Technique of Reversible Logic Circuits Based on Exclusive Testing,” The 26th IEEE Asian Test Symposium, Taiwan, November 27-30, 2017.
  122. Archi  Bhattacharya and Debesh Kumar Das, “ Do Traditional Arabic Music and Hindustani Classical Music have Same Root?” 23rd International Symposium on Frontiers of Research in Speech and Music (FRSM) 2017, NIT Rourkela, December, 2017.
  123. Sabyasachee Banerjee, Subhashis Majumder, Abhishek Varma and Debesh K. Das, “A Placement Optimization Technique for 3D IC” 7th International Symposium on Embedded Computing and System Design, NIT Durgapur, December 2017.
  124. Subrata Das and Debesh K Das, “Steiner Tree Construction for Graphene Nanoribbon Based Circuits in Presence of Obstacles,” IEEE International Symposium on Devices, Circuits and Systems (ISDCS 2018), IIEST Shibpur, 29-31 March, 2018
  125. Subrata Das and Debesh K Das, “Floorplanning in Graphene Nanoribbon (GNR) Based Circuits,” IEEE Computer Society Annual Symposium on VLSI, Hong Kong, 9-11 July 2018.
  126. Tanusree Kaibarta and Debesh K. Das, “Optimization of Test Wrapper Length for TSV Based 3D SOCs Using a Heuristic Approach,” IEEE International Symposium on VLSI Design and Test, June 28-30, 2018, Madurai, India.
  127. Arindam Banerjee and Debesh Kumar Das, “Arithmatic Circuits using Reversible Logic: A Survey Report,” 6th International Doctoral Symposium on Applied Computation and Security Systems (ACSS-2019), Kolkata, March 2019.
  128. Archi  Bhattacharya and Debesh Kumar Das, “A Study of the Raga Zeelaf and its Relationship with Arabian Traditional Music,” 24th International Symposium on Frontiers of Research in Speech and Music (FRSM) 2019, Kanpur, July, 2019.
  129. Sayantani Roy, Debesh Kumar Das and Arighna Deb, “Delay efficient all-optical carry lookahead adder,” IEEE International Symposium on VLSI Design and Test, July 2019, IIT Indore, India.
  130. Subrata Das, Soumya Pandit, Debesh Kumar Das, “Crosstalk Aware Global Routing of Graphene Nanoribbon Based Circuits,” IEEE International Conference on Nanotechnology, Macau, July 2019.
  131. Arighna Deb and Debesh Kumar Das, “Detailed Fault Model for Physical Quantum Circuits,” The 28th IEEE Asian Test Symposium, Kolkata, India, December 10-13, 2019.

Comment Form

You must be logged in to post a comment.

About the Author

Prof Debesh Das, born in 1960 has done his Ph.D. in 1997 from Jadavpur University after completion of Master and Bachelor Degree respectively in 1984 and 1982 in Electronics & Tele-Communication Engineering from the same University. Read More.

Photostream

Categories

Archives

  • No comments
April 2024
M T W T F S S
« Feb    
1234567
891011121314
15161718192021
22232425262728
2930  

Copyright © 2011 - Dr. Debesh Das Developed and maintained by Sidus Technologies | Log in